Degradation of GaN-on-GaN vertical diodes submitted to high current stress
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Microelectronics Reliability
سال: 2018
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2018.06.041